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Senior AFM Applications Scientist (UK) – Semiconductor Metrology

Infinitesima
CompanyInfinitesima
CategoryScience & Research
LocationAbingdon
RemoteOn-site (inferred)
EmploymentNot stated
LevelSenior
SalaryNot stated by the employer
Posted9 Jun 2026
Last verified9 Aug 2026
SourceEmployer ATS (greenhouse)
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Description
  Senior AFM Applications Scientist – Semiconductor Metrology £65,000 – £75,000 + EMI Share Options + Private Healthcare + Pension Are you an experienced Atomic Force Microscopy (AFM) specialist looking to influence the future of semiconductor metrology? We're looking for a Senior AFM Applications Scientist to act as the critical link between customers, engineering and product development, helping shape how our technology performs in advanced semiconductor manufacturing environments around the world. This is a highly visible role combining customer engagement, scientific problem-solving, product development and advanced characterisation. You'll work directly with leading semiconductor customers, helping solve complex measurement challenges while influencing the next generation of AFM-based metrology solutions. If you're passionate about AFM and want to see your expertise directly impact both customer success and product innovation, we'd love to hear from you. What you'll be doing Leading customer demonstrations, evaluations and characterisation programmes Acting as the technical authority for AFM applications and semiconductor metrology challenges Presenting technical findings and performance data to customers and internal stakeholders Supporting global customers with complex application and measurement challenges Troubleshooting multidisciplinary issues involving optics, software, electronics, algorithms and mechanical systems Driving application-focused development projects that improve product performance and customer outcomes Acting as the voice of the customer, translating market needs into future product enhancements Working alongside Engineering and R&D teams to influence product roadmap decisions Supporting and developing world-class applications laboratory capability Travelling internationally (approximately 50%) to support customer sites, evaluations and strategic projects We're particularly interested in people with experience in: Atomic Force Microscopy (AFM) Semiconductor Metrology Semiconductor Process Control Semiconductor Process Characterisation Advanced Surface Analysis Nanoscale Measurement Scanning Probe Microscopy (SPM) Semiconductor Inspection Systems Defect Analysis and Yield Improvement Essential experience Minimum 5 years of hands-on Atomic Force Microscopy (AFM) experience Semiconductor industry experience with strong practical application knowledge Leading customer-facing technical projects, demonstrations or evaluations Supporting advanced metrology or scientific instrumentation systems Characterisation of complex materials, structures or semiconductor devices Diagnosing and resolving multidisciplinary technical issues Strong presentation and stakeholder communication skills Ability to translate customer requirements into actionable development opportunities Experience working across engineering, scientific and commercial teams Nice to have Semiconductor process development experience Scanning Electron Microscopy (SEM) Optical systems, lasers or fibre-optic technologies Electronics or precision electromechanical systems Product marketing, technical positioning or customer storytelling Experience influencing product roadmaps through customer insight Cleanroom or semiconductor fabrication environments Qualifications Master's degree, PhD or equivalent experience in Physics, Materials Science, Engineering, Nanotechnology or a related scientific discipline or Significant commercial experience gained within AFM, semiconductor metrology or advanced scientific instrumentation environments Why join Infinitesima? Infinitesima develops advanced Atomic Force Microscopy technology designed specifically for semiconductor manufacturing applications. As semiconductor devices continue to scale in complexity, accurate nanoscale measurement becomes increasingly critical. Ou